Reports

Effect of Ultraviolet Pretreatment on Yield of Mutations by X-rays in Wheat

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Science  20 Nov 1959:
Vol. 130, Issue 3386, pp. 1407-1409
DOI: 10.1126/science.130.3386.1407

Abstract

A decrease in the yield of chromosomal aberrations in root meristems of wheat induced by four different doses of x-rays has been found to occur when the seeds are pretreated with ultraviolet radiation. However, in X2 generation, the mutation rate for combined treatment is lower than for x-rays alone in lower dosages and higher than for x-rays alone in higher dosages.

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