Reports

High-Voltage Laue X-ray Photography of Large Single Crystals

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Science  09 Oct 1964:
Vol. 146, Issue 3641, pp. 260-261
DOI: 10.1126/science.146.3641.260

Abstract

The perfection of relatively large single crystals can be tested by Laue transmission x-ray diffraction photographs by using much higher voltages for the x-ray generation than are used in conventional diffraction experiments. The technique can be used for determining the orientation spread of subcrystal units and for studying the loss of primary extinction due to occluded chemical impurities. An advantage of this method is its possible application to crystals inside polycrystalline or glass containers.