Reports

Application of High-Resolution Semiconductor Detectors in X-ray Emission Spectrography

+ See all authors and affiliations

Science  04 Feb 1966:
Vol. 151, Issue 3710, pp. 562-568
DOI: 10.1126/science.151.3710.562

Abstract

Solid-state devices developed primarily for nuclear gamma spectroscopy have many potential uses in x-ray analysis.

Related Content