Reports

Solid-State Energy-Dispersion Spectrometer for Electron-Microprobe X-ray Analysis

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Science  02 Feb 1968:
Vol. 159, Issue 3814, pp. 528-530
DOI: 10.1126/science.159.3814.528

Abstract

Improved lithium-drifted silicon solid-state detectors allow detection and energy dispersion of x-rays of about 3 to 30 kiloelectron volts in the electron-microprobe x-ray analyzer. Energy resolution is sufficient to separate peaks of characteristic x-rays of elements adjacent in the periodic system at atomic number 20 and higher. The detected x-ray spectrum emitted from an unknown sample can be recorded with a multichannel analyzer in approximately 60 seconds.