Reports

Y-Modulation: An Improved Method of Revealing Surface Detail Using the Scanning Electron Microscope

Science  18 Jul 1969:
Vol. 165, Issue 3890, pp. 283-285
DOI: 10.1126/science.165.3890.283

This is a PDF-only article. The first page of the PDF of this article appears below.

PDF extract preview

Related Content