Reports

X-ray Measurements near High-Power Klystrons

Science  03 Jul 1970:
Vol. 169, Issue 3940, pp. 52-54
DOI: 10.1126/science.169.3940.52

Abstract

The intensity and quality of the x-radiation outside the lead shielding around ultrahigh-frequency and S-band klystrons were measured as a function of high voltage, pulse frequency, and microwave power output by use of ionization chambers. Independent 20 percent increases in each variable gave, respectively, 8-, 1.2-, and 1.5-fold increases in the intensity, and 36, 1, and 4 percent increases in the mean energy of the x-rays.

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