Electron Microscopy and Diffraction of Layered, Superconducting Intercalation Complexes

See allHide authors and affiliations

Science  29 Oct 1971:
Vol. 174, Issue 4008, pp. 498-500
DOI: 10.1126/science.174.4008.498


Several layered, transition metal dichalcogenide intercalation complexes with unique superconducting properties have been examined by high-resolution electron microscopy and electron diffraction. Details of the crystalline lattice and of the lattice imperfections have been directly resolved. The results can be correlated with the available x-ray diffraction and chemical data, and they confirm and extend the postulated models.