Reports

A Scanning X-Ray Microscope Using Synchrotron Radiation

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Science  10 Nov 1972:
Vol. 178, Issue 4061, pp. 608-611
DOI: 10.1126/science.178.4061.608

Abstract

Focused synchrotron radiation collimated by means of a pinhole has been used to construct a scanning x-ray microscope capable of making stereoscopic element-discriminating pictures of relatively thick specimens in an atmospheric environment.