Reports

Is a Scanning Ion Microscope Feasible?

Science  12 Jan 1973:
Vol. 179, Issue 4069, pp. 173-175
DOI: 10.1126/science.179.4069.173

Abstract

Atomic collisions of high-energy heavy ions produce large yields of x-rays. The small de Broglie wavelength of massive ions leads to an estimate of 0.2 angstrom for the resolution of a microscope utilizing nitrogen ions with energies of 14 million electron volts. Estimates of the yield of x-rays relative to molecular radiation damage of the bases in DNA are made.

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