Silicon identification in prosthesis-associated fibrous capsules

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Science  27 Jan 1978:
Vol. 199, Issue 4327, pp. 437-439
DOI: 10.1126/science.619466


The use of correlated microscopic techniques, including the scanning electron microscopic modes of backscattered electron imaging and energy dispersive x-ray analysis, aid in defining the process of dispersion of silicon-containing material around silicone rubber (polydimethylsiloxane) prosthetic devices.