Articles

Normal Metallic Point Contacts

Science  10 Mar 1978:
Vol. 199, Issue 4333, pp. 1037-1040
DOI: 10.1126/science.199.4333.1037

Abstract

The measured voltage derivative of the nonlinear resistance of tiny point contacts can be separated into a phonon-emission effect (α2F) and an analytic functional form (background effect). The α2F's show structure coincident with bulk phonon densities of states. Values of the integral of 2 α2F/ω are closely related to literature values. The background effect is related to the impurity concentration of the materials.