Transmission Electron Microscopy: Direct Observation of Crystal Structure in Refractory Ceramics

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Science  10 Nov 1978:
Vol. 202, Issue 4368, pp. 625-626
DOI: 10.1126/science.202.4368.625


Using high-resolution multibeam interference techniques in the transmission electron microscope, images have been obtained that make possible a real-space structure analysis of a beryllium-silicon-nitrogen compound. The results illustrate the usefulness of lattice imaging in the analysis of local crystal structure in these technologically promising ceramic materials.