Delayed Light Imaging for the Early Detection of Plant Stress

See allHide authors and affiliations

Science  26 Feb 1982:
Vol. 215, Issue 4536, pp. 1104-1106
DOI: 10.1126/science.215.4536.1104


Image-intensified photographs of delayed light emission (DLE) from soybean leaves exposed to sulfur dioxide showed evidence of the stress that developed during the exposure period. A comparison of DLE images taken during the fumigation with a conventional photograph taken 5 days later showed a clear correspondence between leaf areas that had the most diminished DLE intensity and those that showed the greatest visible injury. These results suggest that DLE imagery will be a useful tool in the investigation of the spatial distribution and temporal development of plant stress.