Defect Motion on an InP(110) Surface Observed with Noncontact Atomic Force Microscopy

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Science  08 Dec 1995:
Vol. 270, Issue 5242, pp. 1646-1648
DOI: 10.1126/science.270.5242.1646


With an atomic force microscope operating in the noncontact mode in an ultrahigh vacuum, atomic-resolution imaging of the cleaved semi-insulating InP(110) surface has been achieved. By this method, atomic scale point defects and their motion were observed at room temperature, without the field-induced effects associated with scanning tunneling microscopy.