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Images of Interlayer Josephson Vortices in Tl2Ba2CuO6+δ

Science  20 Feb 1998:
Vol. 279, Issue 5354, pp. 1193-1196
DOI: 10.1126/science.279.5354.1193

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Abstract

The strength of the interlayer Josephson tunneling in layered superconductors is an essential test of the interlayer tunneling model as a mechanism for superconductivity, as well as a useful phenomenological parameter. A scanning superconducting quantum interference device (SQUID) microscope was used to image interlayer Josephson vortices in Tl2Ba2CuO6+ δ and to obtain a direct measure of the interlayer tunneling in a high–transition temperature superconductor with a single copper oxide plane per unit cell. The measured interlayer penetration depth, λc, is ∼20 micrometers, about 20 times the penetration depth required by the interlayer tunneling model.

  • Present address: Lucent Technologies, 2000 North Naperville Road, Naperville, IL 60566, USA.

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