Quantum-Critical Conductivity Scaling for a Metal-Insulator Transition

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Science  28 Jan 2000:
Vol. 287, Issue 5453, pp. 633-636
DOI: 10.1126/science.287.5453.633

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Temperature (T)- and frequency (ω)-dependent conductivity measurements are reported here in amorphous niobium-silicon alloys with compositions (x) near the zero-temperature metal-insulator transition. There is a one-to-one correspondence between the frequency- and temperature-dependent conductivity on both sides of the critical concentration, thus establishing the quantum-critical nature of the transition. The analysis of the conductivity leads to a universal scaling function and establishes the critical exponents. This scaling can be described by anx-, T-, and ω-dependent characteristic length, the form of which is derived by experiment.

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