You May Squeeze the Atoms But Don't Mangle the Surface!

See allHide authors and affiliations

Science  30 Mar 2001:
Vol. 291, Issue 5513, pp. 2561-2562
DOI: 10.1126/science.1060014

You are currently viewing the summary.

View Full Text

Log in to view the full text

Log in through your institution

Log in through your institution


Since the first prototype was developed in 1986, the Atomic Force Microscope (AFM) has become an ever more powerful tool for characterizing surfaces. In his Perspective, de Lozanne charts recent progress in this field, and highlights the study by Lantz et al. , who are able to measure the force resulting from an incipient bond between the tip atom and the surface atom and to distinguish between different types of silicon atoms. For the first time, atomic resolution and a detailed measurement of these forces are obtained on the same surface.