Electrically Induced Optical Emission from a Carbon Nanotube FET

See allHide authors and affiliations

Science  02 May 2003:
Vol. 300, Issue 5620, pp. 783-786
DOI: 10.1126/science.1081294

You are currently viewing the abstract.

View Full Text


Polarized infrared optical emission was observed from a carbon nanotube ambipolar field-effect transistor (FET). An effective forward-biased p-n junction, without chemical dopants, was created in the nanotube by appropriately biasing the nanotube device. Electrical measurements show that the observed optical emission originates from radiative recombination of electrons and holes that are simultaneously injected into the undoped nanotube. These observations are consistent with a nanotube FET model in which thin Schottky barriers form at the source and drain contacts. This arrangement is a novel optical recombination radiation source in which the electrons and holes are injected into a nearly field-free region. Sucha source may form the basis for ultrasmall integrated photonic devices.

    View Full Text