Aberration-Corrected Electron Microscopy

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Science  25 Jul 2008:
Vol. 321, Issue 5888, pp. 461
DOI: 10.1126/science.321.5888.461b

Transmission electron microscopes have been used for a long time to study the structures of materials, but aberrations introduced by the electron optics of the instruments have limited their spatial resolution. Urban (p. 506) reviews recent advances in developing instruments that are largely free of aberrations. These aberration-corrected electron microscopes allow atomic positions to be determined with unprecedented accuracy. Furthermore, they enable determination of the occupancies of atom sites and atomic-scale imaging of chemical composition and bonding. The instruments have been used to study, for example, twin-boundary structures, sublattice structures in multilayered materials, and the atom arrangements in catalyst particles.

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