Technical Comments

Comment on “The Local Structure of Amorphous Silicon”

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Science  21 Dec 2012:
Vol. 338, Issue 6114, pp. 1539
DOI: 10.1126/science.1221738

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Abstract

Treacy and Borisenko (Reports, 24 February 2012, p. 950) argue from reverse Monte Carlo modeling of electron diffraction and fluctuation electron microscopy data that amorphous silicon is paracrystalline and not described by a continuous random network. However, their models disagree with high-resolution x-ray measurements and other evidence, whereas the agreement with fluctuation electron microscopy is at best qualitative.

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