Technical Comments

Response to Comment on “The Local Structure of Amorphous Silicon”

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Science  21 Dec 2012:
Vol. 338, Issue 6114, pp. 1539
DOI: 10.1126/science.1222571

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Abstract

The averaged diffraction data alone cannot distinguish between models with different heterogeneous structures at length scales of about 2 nanometers, even when using high-resolution data. Although our approach to calculating diffraction intensities from the model differs from that of Roorda and Lewis, paracrystallinity in amorphous silicon is undeniably evident in the raw experimental fluctuation electron microscopy data.

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