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Science  02 May 2014:
Vol. 344, Issue 6183, pp. 539
DOI: 10.1126/science.344.6183.539-a


JEOL and Nikon have integrated optical microscopy and field emission scanning electron microscopy in a way that enables seamless observation of the same region of interest on a sample with fast, accurate navigation. The technique, MiXcroscopy, employs the same specimen holder for both the optical microscope (OM) and the scanning electron microscope (SEM). The specimen stage registration is fully controlled by dedicated software that allows the OM and SEM to share, recall, and observe exact locations of specific areas on the specimens. The Nikon ECLIPSE LV-N series optical microscope and any of the JEOL JSM-7000 series Field Emission SEMs work concurrently as the optical image taken on the OM, along with specimen stage coordinates, are transferred to the SEM for navigation and correlation via Nikon's Elements software. When the sample holder is moved to the SEM, the researcher can observe detailed structures at higher magnifications and easily compare to the optical image on screen.


Spero is a laser-based infrared microscopy platform that opens up a new world of research possibilities with breakthrough chemical imaging and analysis on a real-time basis. Spero offers a unique combination of unparalleled visibility, instantaneous results in "live mode," and a small resource footprint to easily fit into any lab setting. By seamlessly incorporating a high-brightness, broadly tunable mid-infrared laser source, Spero provides unprecedented image resolution with an ultrawide field of view. This unique combination enables researchers to observe micron-scale features while also covering large areas very quickly for high throughput applications. The instrument operates in the feature-rich mid-infrared region and provides high-fidelity spectral data for the accurate identification of molecular and chemical components of complex, heterogeneous samples. Spero is powered by an elegant and easy-to-use spectral imaging software platform that enables both novice and expert users to quickly generate high-quality images and accurate spectral information.


The XploRAPLUS is a fully confocal and high-performance Raman microscope, offering an unmatched and enhanced range of options such as multiple laser wavelengths, complete automation, EMCCD detection, Raman polarization, and even AFM coupling. Our SWIFT Fast Raman imaging offers the best and most detailed Raman images, typically 10x faster than conventional mapping methods. The new LabSpec 6.3 software offers features ideally suited to multiple user environments, such as HORIBA's "One-Click" Raman. Ensuring easy and reliable Raman measurements, HORIBA One-Click will automatically adapt and optimize data acquisition parameters, producing quality Raman spectra time after time. Security of the system and hardware is assured by user-specific LabSpec software login accounts, while LabSpec sample "methods" provide an ideal way to standardize or automate Raman analysis at the touch of a button. The XploRA PLUS is the full Raman microscope package.


The nano3DX is a true X-ray microscope with the ability to measure relatively large samples at high resolution. The nano3DX images the entire sample from multiple angles and can reconstruct a 3-D image at 0.27 μm resolution. The computer model allows the user to view sections at any point on any plane, providing valuable insights into the structure of the sample. The secret behind the nano3DX is the high-power rotating anode and high-resolution optics coupled with submicron charge-coupled device technology. This combination is capable of fast data collection and has the ability to switch anode materials rapidly to optimize data acquisition. Furthermore, the magnification occurs in the detector using true microscope elements. The geometry of the system allows the sample to be located very close to the high-resolution detector, which provides near-parallel beam optics. This design results in improved instrument stability, which prevents smearing and allows for faster data collection times.


RISE Microscopy is a novel correlative microscopy technique which combines confocal Raman Imaging and Scanning Electron (RISE) Microscopy within one integrated microscope system. This unique combination provides clear advantages for the microscope user with regard to comprehensive sample characterization: electron microscopy is an excellent technique for visualizing the sample surface structures in the nanometer range, and confocal Raman imaging is an established spectroscopic method used for the detection of the chemical and molecular components of a sample. It can also generate 2-D and 3-D images and depth profiles to visualize the distribution of the molecular compounds within a sample. The RISE Microscope enables the acquisition of SEM and Raman images from the same sample area and the correlation of ultrastructural and chemical information. Between the different measurements, an extremely precise scan stage automatically transfers the sample inside the microscope's vacuum chamber and repositions it. The integrated RISE software carries out the required parameter adjustments and instrument alignments. The acquired results can then be correlated and the Raman and SEM images overlaid.

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