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Science  12 Jun 2015:
Vol. 348, Issue 6240, pp. 1274
DOI: 10.1126/science.348.6240.1274-a

Compact Microscope

Enabling maximum comfort and ease-of-use for routine observations, the high-performing, ergonomically designed, compact, and robust CX23 microscope is packed full of features to enhance every step of the workflow. Delivering Olympus' renowned high-quality optics and featuring updates to increase portability, usability, sturdiness, and security, the new microscope is ideal both for educational and routine lab environments as well as for use in the field. High-performing, quality optics include a quadruple nosepiece equipped with Olympus' plan achromat objectives ensuring a wide field of view with a field number of 20. The objectives maintain superb image flatness throughout the field of view and long working distances supported by a focus lock to prevent objectives and specimens from damage. An LED light source provides both a long service time of 20,000 hours and lower power consumption while the reduced blue light preserves vivid color observation on HE staining.

FT-IR/NIR Imaging Systems

Spotlight Systems are a complete family of high-performance FT-IR microscopy and FT-IR/NIR chemical imaging systems. The new Spotlight 150i and Spotlight 200i can be configured with either a PerkinElmer Frontier FT-IR optical bench, or a Spectrum Two optical bench. Both system configurations are powered by the acclaimed DynaScan Interferometer, which provides performance without the compromise of competitive designs. Frontier Spotlight Microscopy and Imaging System options include both transmission and reflection microsampling, and its Micro ATR Imaging option provides information down to areas as small as 3 &um;m. A number of sample automation and detector options are available to suit many applications. Each system is engineered to the highest quality specifications, providing high-energy throughput, reproducibility, and confidence in the quality of your result. Spotlight imaging systems reveal the identity of a vast array of chemical components within materials as well as displaying areas of homogeneity and variation.

EMCCD Spectroscopy Camera

The new Synapse EM is a deep-cooled EMCCD Scientific camera for low-light and ultrafast spectroscopy experiments. The Synapse EM is available in front and back illuminated for optimal quantum efficiency. With a sensor format of 1600 x 200 or 1600 x 400 and a pixel size of 16 &um;m, the Synapse EM is the ideal candidate for high spectral resolution measurements. The camera comes with a standard dual readout mode that allows the users to switch automatically between EMCCD mode for low-light measurements and conventional CCD mode for standard spectroscopy. QExtra technology is available standard in the Synapse EM-BIQX and is an antireflective multilayer coating designed to greatly improve quantum efficiency of back illuminated sensors over a broad spectral range, while suppressing undesirable etaloning effects. With a maximum frame rate above 1,600 spectra per second and outstanding linearity, the Synapse EM is the ideal EMCCD scientific camera for Raman, SERS/TERS, multitrack, transient, and single molecule spectroscopic applications.

Light Sheet Microscope Module

The Leica TCS SP8 DLS is a digital light sheet microscope, which is fully integrated into the Leica TCS SP8 confocal microscope for the observation of developmental processes in real time and 3-D. The synergy of light sheet and confocal microscopy opens novel fields of application. Light sheet microscopy is a gentle method of imaging light-sensitive samples or fast biological processes in whole organisms, since the specimen is illuminated in a single plane. The novelty of Leica Microsystems' approach lies in the integration of a light sheet module into an inverted Leica TCS SP8 confocal system. The TwinFlect mirror, which deflects the illuminating light sheet at a 90°gle, makes it possible to combine digital light sheet and confocal imaging in one system without compromising confocal functionality. This is a clear distinction from other solutions that require a dedicated optical setup on an independent system with perpendicular illuminating and detecting objectives.

Ultra Load Stage

The new Ultra Load Stage is designed for ZEISS Xradia Ultra 3-D X-ray microscopes and enables in situ nanomechanical testing—compression, tension, and indentation—with nondestructive 3-D tomographic imaging. For the first time, researchers will be able to image the evolution of structure in 3-D under load down to 50 nm resolution. Xradia Ultra Load Stage explores a new critical length scale for in situ materials characterization, enabling researchers to observe internal features such as nanoscale cracks and voids that ultimately lead to deformation and failure at the macroscale. Ultra Load Stage satisfies a void in the current availability of mechanical testing and imaging approaches, offering new capabilities to observe internal processes at nanoscale resolution. Until now, electron microscopy techniques provided resolution down to the nanometer range but are limited to surface imaging or required extremely thin samples whose mechanical behavior will be strongly affected by surface effects.

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  • Newly offered instrumentation, apparatus, and laboratory materials of interest to researchers in all disciplines in academic, industrial, and governmental organizations are featured in this space. Emphasis is given to purpose, chief characteristics, and availabilty of products and materials. Endorsement by Science or AAAS of any products or materials mentioned is not implied. Additional information may be obtained from the manufacturer or supplier.

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