Atomic-resolution transmission electron microscopy of electron beam–sensitive crystalline materials

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Science  09 Feb 2018:
Vol. 359, Issue 6376, pp. 675-679
DOI: 10.1126/science.aao0865

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Crystallography of sensitive materials

High-resolution transmission electron microscopy is an invaluable tool for looking at the crystalline structures of many materials. However, the need for high beam doses, especially as a sample is rotated to find the crystal axes, can lead to damage, particularly in fragile materials. Zhang et al. combined a state-of-the-art direct-detection electron-counting camera with ways to limit the overall electron dose to analyze delicate materials such as metal organic frameworks. With this approach, they could see the benzene rings in a UiO-66 linker and the coexistence of ligand-free (metal-exposing) and ligand-capped surfaces in UiO-66 crystals.

Science, this issue p. 675