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Field Ion Microscopy. Principles and Applications. Erwin W. Müller and Tien Tzou Tsong. Elsevier, New York, 1969. x, 314 pp., illus. $19

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Science  04 Sep 1970:
Vol. 169, Issue 3949, pp. 970
DOI: 10.1126/science.169.3949.970
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