Spot-scan imaging in transmission electron microscopy

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Science  04 Jan 1991:
Vol. 251, Issue 4989, pp. 53-59
DOI: 10.1126/science.1846047


The determination of the structure of proteins and other organic materials by transmission electron microscopy is a rapidly developing field. Obtaining high-resolution images of these radiation-sensitive specimens has, until recently, been problematic. The development of spot-scan imaging, in which the electron beam is focused to a spot with a diameter of about 1000 angstroms and moved over the specimen to record the image, has overcome some of the most severe problems, which result from beam-induced motion of the specimen and its image. Elimination of this motion greatly enhances the contrast of high-resolution features of the image and promises a significant increase in the speed with which future structural work can be accomplished.

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