Atomic Force Microscope Studies of Fullerene Films: Highly Stable C60 fcc (311) Free Surfaces

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Science  12 Jul 1991:
Vol. 253, Issue 5016, pp. 171-173
DOI: 10.1126/science.253.5016.171


Atomic force microscopy and x-ray diffractometry were used to study 1500 Å-thick films of pure C60 grown by sublimation in ultrahigh vacuum onto a CaF2 (111) substrate. Topographs of the films did not reveal the expected close-packed structures, but they showed instead large regions that correspond to a face-centered cubic (311) surface and distortions of this surface. The open (311) structure may have a relatively low free energy because the low packing density contributes to a high entropy of the exposed surface.

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