Applied Physics

X-rays Hit the Nanospot

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Science  14 Mar 2003:
Vol. 299, Issue 5613, pp. 1629
DOI: 10.1126/science.299.5613.1629a

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Although recent developments in hard x-ray optics have enabled techniques such as scanning probe microscopy and microfluorescence tomography, improvement of the limited lateral extent of the x-ray beam, which typically is in the micrometer range, is desirable, particularly for applications in nanotechnology and for imaging small volumes of biological samples. Schroer et al. describe the realization of x-ray nanofocusing lenses fabricated in a diamond substrate. An array of planar refractive lenses is fabricated with 50 or 100 individual lenses aligned along a common optical axis, focusing the x-ray beam into a series of lines. Orthogonal placement of a second lens array behind the first then allows the x-ray beam to be focused in two dimensions to a spot. They show that x-rays can be focused to a spot size of 380 nm by 210 nm but expect to achieve even smaller dimensions with further optimization. — ISO

Appl. Phys. Lett.82, 1485 (2003).

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