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Summary
Silicon oxide (silica) glass plays a key role in many modern technologies, from semiconductor devices and optical fibers to supporting materials in heterogeneous catalysis and novel durable glasses. Yet little is known about the atomic structure of amorphous materials. Recent studies of two-layer glass structures have started to shed light on the structure of amorphous silica (1, 2). On page 224 of this issue, Huang et al. provide direct evidence for dynamic rearrangements of such two-dimensional (2D) silica films under a probing electron beam (3).
