Article Information
vol. 366 no. 6467 860-864
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History:
- Received for publication August 5, 2019
- Accepted for publication October 21, 2019
- .
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Copyright © 2019 The Authors, some rights reserved; exclusive licensee American Association for the Advancement of Science. No claim to original U.S. Government Works http://www.sciencemag.org/about/science-licenses-journal-article-reuseThis is an article distributed under the terms of the Science Journals Default License.
Author Information
- Christian Haffner1,2,3,*,
- Andreas Joerg1,
- Michael Doderer1,
- Felix Mayor1,†,
- Daniel Chelladurai1,
- Yuriy Fedoryshyn1,
- Cosmin Ioan Roman4,
- Mikael Mazur5,
- Maurizio Burla1,
- Henri J. Lezec3,
- Vladimir A. Aksyuk3,
- Juerg Leuthold1
- 1Institute of Electromagnetic Fields (IEF), ETH Zurich, 8092 Zurich, Switzerland.
- 2Maryland NanoCenter, Institute for Research in Electronics and Applied Physics, University of Maryland, College Park, MD 20742, USA.
- 3Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
- 4Micro- and Nanosystems, ETH Zurich, 8092 Zurich, Switzerland.
- 5Photonics Laboratory, Department of Microtechnology and Nanoscience, Chalmers University of Technology, Gothenburg, Sweden.
- ↵*Corresponding author. Email: christian.haffner{at}nist.gov
