Article Information
vol. 371 no. 6528 517-521
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History:
- Received for publication August 17, 2020
- Accepted for publication January 4, 2021
- .
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Copyright © 2021 The Authors, some rights reserved; exclusive licensee American Association for the Advancement of Science. No claim to original U.S. Government Works https://www.sciencemag.org/about/science-licenses-journal-article-reuseThis is an article distributed under the terms of the Science Journals Default License.
Author Information
- Wentao Yuan1,*,
- Beien Zhu2,3,*,
- Ke Fang1,*,
- Xiao-Yan Li3,4,
- Thomas W. Hansen5,†,
- Yang Ou1,
- Hangsheng Yang1,
- Jakob B. Wagner5,†,
- Yi Gao2,3,†,
- Yong Wang1,†,
- Ze Zhang1
- 1State Key Laboratory of Silicon Materials and Center of Electron Microscopy, School of Materials Science and Engineering, Zhejiang University, Hangzhou, 310027 China.
- 2Interdisciplinary Research Center, Zhangjiang Laboratory, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai, 201210 China.
- 3Key Laboratory of Interfacial Physics and Technology, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai, 201800 China.
- 4University of Chinese Academy of Sciences, Beijing, 100049 China.
- 5DTU Nanolab, Technical University of Denmark, DK-2800, Kgs. Lyngby, Denmark.
- ↵†Corresponding author. Email: yongwang{at}zju.edu.cn (Y.W.); gaoyi{at}zjlab.org.cn (Y.G.); thwh{at}dtu.dk (T.W.H.); jabw{at}dtu.dk (J.B.W.)
↵* These authors contributed equally to this work.
