In situ manipulation of the active Au-TiO2 interface with atomic precision during CO oxidation

See allHide authors and affiliations

Science  29 Jan 2021:
Vol. 371, Issue 6528, pp. 517-521
DOI: 10.1126/science.abe3558

Article Information

vol. 371 no. 6528 517-521

Print ISSN: 
Online ISSN: 
  • Received for publication August 17, 2020
  • Accepted for publication January 4, 2021
  • .

Author Information

  1. Wentao Yuan1,*,
  2. Beien Zhu2,3,*,
  3. Ke Fang1,*,
  4. Xiao-Yan Li3,4,
  5. Thomas W. Hansen5,,
  6. Yang Ou1,
  7. Hangsheng Yang1,
  8. Jakob B. Wagner5,,
  9. Yi Gao2,3,,
  10. Yong Wang1,,
  11. Ze Zhang1
  1. 1State Key Laboratory of Silicon Materials and Center of Electron Microscopy, School of Materials Science and Engineering, Zhejiang University, Hangzhou, 310027 China.
  2. 2Interdisciplinary Research Center, Zhangjiang Laboratory, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai, 201210 China.
  3. 3Key Laboratory of Interfacial Physics and Technology, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai, 201800 China.
  4. 4University of Chinese Academy of Sciences, Beijing, 100049 China.
  5. 5DTU Nanolab, Technical University of Denmark, DK-2800, Kgs. Lyngby, Denmark.
  1. Corresponding author. Email: yongwang{at} (Y.W.); gaoyi{at} (Y.G.); thwh{at} (T.W.H.); jabw{at} (J.B.W.)
  1. * These authors contributed equally to this work.


Article usage

Article usage: January 2021 to March 2021

Jan 2021371615901456
Feb 20213138939844
Mar 2021897527484

Stay Connected to Science