Supplementary Materials

Tailored semiconductors for high-harmonic optoelectronics

Murat Sivis, Marco Taucer, Giulio Vampa, Kyle Johnston, André Staudte, Andrei Yu. Naumov, D. M. Villeneuve, Claus Ropers, P. B. Corkum

Materials/Methods, Supplementary Text, Tables, Figures, and/or References

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  • Materials and Methods 
  • Supplementary Text 
  • Figs. S1 to S8 
  • Captions for Movies S1 to S3 
  • References 

Images, Video, and Other Media

Movie S1
Far-field intensity of the third- and fifth-harmonic orders, red and blue, respectively, recorded for a spatial scan of the laser focus over individual grating structures. The focal spot size and direction of the scan is indicated in Fig. S1.
Movie S2
Movie S3
Fifth-harmonic signal in the image plane (recorded with a 410 nm bandpass filter and 2.05 μm diving wavelength, see Fig. S4), recorded for a spatial scan over one of the structures. Here, the contrast of the Movies S2 and S3 is adjusted to the signal from the bulk and the hotspots in the structures, respectively.